Welcome to the nomad-inl-base documentation

nomad-inl-base is a NOMAD plugin developed at INL – International Iberian Nanotechnology Laboratory for the Sadewasser Reasearch Group (Previously know as Laboratory for Nanostructured Solar Cells - LaNaSC) group. It provides ELN (Electronic Lab Notebook) schemas and automatic normalization routines for thin-film research covering:

• STAR (SpuTtering for Advanced Research) magnetron sputtering – DC, RF, and reactive DC (pulsed Se) deposition; selenization annealing; substrate heating and rotation; target inventory tracking
• METEOR (Metal EvaporaTion by Electron-beam for SOlar Research) e-beam evaporation – Korvus Technology METEOR system with .nbl log parser, four-pocket management, QCM thickness monitoring, and automatic thin film creation
• Wet deposition – spin coating, slot-die coating, blade coating, inkjet printing, spray pyrolysis, dip coating, and chemical bath deposition
• Characterization – XRD, UV-Vis transmission, 4-point probe, KLA-Tencor profilometry, EQE, solar cell IV, GDOES, SEM, EDX/EDS spectra, Bruker AFM/KPFM/cAFM, cyclic voltammetry (CV), linear-sweep voltammetry (IV), electrochemical impedance spectroscopy (EIS), and chronoamperometry
• Shared entities – substrates, thin films, thin-film stacks, instruments, selenium cells, and sample fragments referenced across all schemas

Tutorial

New to the plugin? The tutorial walks you through a complete experiment: creating a substrate, running a spin-coating deposition, and recording an XRD measurement – all linked together through shared entity references.

• Start the tutorial

How-to guides

Practical step-by-step instructions for common tasks:

• Install this plugin
• Use this plugin
• Contribute to this plugin
• Contribute to the documentation

Explanation

Background concepts: the Entity/Activity model, how ThinFilm chains work, recipe-based automation, the target inventory system, and electrochemistry schemas.

• Read the explanation

Reference

Complete schema reference with all quantities, units, and behavior for each ELN entry type.

• Entities
• STAR Sputtering
• METEOR E-Beam
• Wet Deposition
• Characterization

Schema overview

Schema	Category	Entry type
INLSubstrate	INL Entities	Entity
INLThinFilm	INL Entities	Entity
INLThinFilmStack	INL Entities	Entity
INLInstrument	INL Entities	Entity
INLGraphiteBox	INL Entities	Entity
INLSampleFragment	INL Entities	Entity
SeleniumCell	STAR	Entity
SputteringTarget	STAR	Entity
StarCalibrationData	STAR	Activity
StarSputteringRecipe	STAR	Template
StarRFSputtering	STAR	Activity
StarDCSputtering	STAR	Activity
STARDCReactiveSputtering	STAR	Activity
STARSelenizationAnnealing	STAR	Activity
METEORDeposition	METEOR	Activity
METEORPocket	METEOR	Sub-section
METEORQCMMonitor	METEOR	Sub-section
WetDepositionRecipe	INL Wet Deposition	Template
INLSpinCoatingRecipe	INL Wet Deposition	Template
INLSpinCoating	INL Wet Deposition	Activity
INLSlotDieCoating	INL Wet Deposition	Activity
INLBladeCoating	INL Wet Deposition	Activity
INLInkjetPrinting	INL Wet Deposition	Activity
INLSprayPyrolysis	INL Wet Deposition	Activity
INLDipCoating	INL Wet Deposition	Activity
INLChemicalBathDeposition	INL Wet Deposition	Activity
INLXRayDiffraction	INL Characterization	Measurement
INLUVVisTransmission	INL Characterization	Measurement
INLFourPointProbe	INL Characterization	Measurement
INLKLATencorProfiler	INL Characterization	Measurement
INLEQE	INL Characterization	Measurement
INLSolarCellIV	INL Characterization	Measurement
INLGDOES	INL Characterization	Measurement
INLSEMSession	INL Characterization	Measurement
WorkingElectrode	INL Characterization	Entity
ElectrolyteSolution	INL Characterization	Entity
PotentiostatMeasurement	INL Characterization	Measurement
INLEDXSpectrum	INL Characterization	Measurement
ChronoamperometryMeasurement	INL Characterization	Measurement
EISMeasurement	INL Characterization	Measurement