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Reference – Characterization

This page documents all ELN entry types in the INL Characterization category.

Schema Label Technique
INLXRayDiffraction INL XRD X-Ray Diffraction
INLUVVisTransmission INL UV-Vis Transmission UV-Vis-NIR Transmission
ChronoamperometryMeasurement INL Chronoamperometry Chronoamperometry
PotentiostatMeasurement INL Cyclic Voltammetry Cyclic Voltammetry / IV sweep
INLFourPointProbe INL 4-Point Probe Sheet resistance mapping
INLKLATencorProfiler INL KLA-Tencor Profiler Stylus profilometry
INLEQE INL EQE External Quantum Efficiency
INLSolarCellIV INL Solar Cell IV Solar cell current–voltage
INLGDOES INL GDOES Glow Discharge OES depth profile
INLSEMSession INL SEM Session Scanning Electron Microscopy
INLEDXSpectrum INL EDX Spectrum Energy-Dispersive X-ray spectroscopy
INLAFMSession INL AFM Session Atomic Force Microscopy (AFM / KPFM / cAFM)
EISMeasurement INL EIS Measurement Electrochemical Impedance Spectroscopy

INLCharacterization

Base class: Measurement, EntryData

Abstract base class inherited by all INL characterization schemas (except ChronoamperometryMeasurement, PotentiostatMeasurement, WorkingElectrode, and ElectrolyteSolution, which have their own base classes).

All INLCharacterization subclasses inherit the following fields:

Quantity / Sub-section Type Description
operator str Person who ran the measurement
samples INLSampleReference (repeats) Thin-film stacks or substrates measured

INLSampleReference references an INLThinFilmStack entry, linking each measurement to the sample provenance chain.


INLXRayDiffraction

Base class: ELNXRayDiffraction, EntryData
Label: INL XRD

Extends the nomad-measurements XRD schema with an operator field and a sample reference. Supported file formats: .xrdml, .rasx, .brml, .raw.

Quantity Type Description
operator str Person who ran the measurement

Sub-sections:

Sub-section Type Description
samples INLSampleReference (repeats) Thin-film stacks measured

INLSampleReference references an INLThinFilmStack entry, linking the measurement directly to the sample provenance chain.


INLUVVisTransmission

Base class: ELNUVVisNirTransmission, EntryData
Label: INL UV-Vis Transmission

Extends the nomad-measurements UV-Vis schema. Supported file format: .asc.

Quantity Type Description
operator str Person who ran the measurement

Sub-sections:

Sub-section Type Description
samples INLSampleReference (repeats) Thin-film stacks measured

WorkingElectrode

Base class: INLThinFilmStack, EntryData
Label: defined by INLThinFilmStack
Ontology: voc4cat:0007206

A thin-film stack entry extended with the electrode area used in electrochemical measurements.

Quantity Type Unit Description
area_electrode float cm² Active electrode area

Inherits all INLThinFilmStack fields: layers, substrate, components.


ElectrolyteSolution

Base class: Solution
Ontology: voc4cat:0007206

Extends the solution schema with electrochemistry-specific concentration fields.

Quantity Type Unit Description
molar_concentration float mol/L Molar concentration
molal_concentration float mol/kg Molal concentration

ChronoamperometryMeasurement

Base class: INLCharacterization, PlotSection
Label: INL Chronoamperometry
Ontology: voc4cat:0007206

Records a constant-potential electrochemical experiment and auto-generates a current (density) vs. time plot.

Quantities

Quantity Type Unit Description
voltage_applied float V Applied potential during the experiment
area_electrode float cm² Electrode area for current density calculation

Sub-sections

Sub-section Type Description
current CurrentTimeSeries Time-resolved current measurements

Normalization behavior

  • Converts current to mA
  • If area_electrode is set, divides by area and labels the axis Current density (mA cm⁻²); otherwise labels it Current (mA)
  • Generates a Plotly scatter figure (time on x-axis)

PotentiostatMeasurement

Base class: INLCharacterization, PlotSection
Label: INL Cyclic Voltammetry
Ontology: voc4cat:0007206

Records a cyclic voltammetry experiment and auto-generates a CV curve.

Quantities

Quantity Type Unit Description
rate float mV/s Scan rate
area_electrode float cm² Electrode area for current density calculation

Sub-sections

Sub-section Type Description
current CurrentTimeSeries Time-resolved current
voltage VoltageTimeSeries Time-resolved voltage
scan ScanTimeSeries Scan index as a function of time

Normalization behavior

  • When a scan sub-section is present (CV mode): plots the CV curve for scan 3, falling back to scan 2 and then to all data if earlier scans are empty or entirely NaN
  • When no scan sub-section is present (IV / LSV mode): plots all data points as a single I–V sweep
  • If area_electrode is set, the y-axis shows current density (mA cm⁻²)
  • Generates a Plotly scatter figure (voltage on x-axis)

Time-series helper sections

These internal sections hold the raw array data for electrochemical measurements. They inherit from TimeSeries and hide the set_value and set_time fields.

Class Unit of value Description
CurrentTimeSeries A Current as a function of time
CurrentDensityTimeSeries A/m² Current density as a function of time
VoltageTimeSeries V Voltage as a function of time
ScanTimeSeries Scan index as a function of time

INLFourPointProbe

Base class: INLCharacterization
Label: INL 4-Point Probe

Sheet resistance and resistivity map from a 4-point probe instrument. A spatial scatter plot coloured by sheet resistance is auto-generated during normalization.

File format: upload a *4pp.xls or *4pp.xlsx file — the parser creates the entry automatically.

Quantities

Quantity Type Unit Description
x_size float mm Sample X dimension
y_size float mm Sample Y dimension
exclusion_size float mm Edge exclusion zone
correction_factor float Geometric correction factor F
probe_spacing float mm Distance between probe tips
temperature_coefficient float Resistance temperature coefficient
measurement_temperature float °C Measurement temperature
reference_temperature float °C Reference temperature for correction
measurement_mode str Instrument mode (e.g. SetPoint)

Sub-sections

Sub-section Type Description
results INLFourPointProbeResults (repeats) Statistics and per-point data per run

INLFourPointProbeResults

Sub-section holding the statistical summary and per-point arrays for a single measurement run. A sheet-resistance spatial map is plotted automatically.

Statistics:

Quantity Unit Description
sigma_3_max / sigma_3_min Ω/sq 3 σ bounds of sheet resistance
sheet_resistance_max / min Ω/sq Maximum / minimum across all points
sheet_resistance_ave Ω/sq Mean sheet resistance
sheet_resistance_std_dev Ω/sq Standard deviation
uniformity_pct % Uniformity Uni(%)
sheet_resistance_range Ω/sq Max − Min range
std_dev_over_ave_pct % StDev/Ave(%)

Per-point arrays:

Quantity Unit Description
x_position / y_position mm Coordinates of each point
sheet_resistance Ω/sq Sheet resistance at each point
resistivity Ω·cm Resistivity at each point

INLKLATencorProfiler

Base class: INLCharacterization
Label: INL KLA-Tencor Profiler

Stylus profilometry measurement from the KLA-Tencor P-series profiler.

File format: upload a *[Pp]rofile.pdf file — the parser creates the entry automatically.

Quantities

Quantity Type Unit Description
recipe str Instrument recipe name
site_name str Site label from the instrument
scan_length float µm Total scan length
scan_speed float µm/s Stylus scan speed
sample_rate float Hz Data acquisition rate
scan_direction str Scan direction
repeats int Number of scan repeats
stylus_force float mg Stylus contact force
noise_filter float µm Noise filter wavelength cut-off

Sub-sections

Sub-section Type Description
results INLKLATencorProfilerResults (repeats) Step height and roughness parameters per site

INLKLATencorProfilerResults

Quantity Unit Description
step_height Å Step height (St Height) between cursor regions
Ra Å Average roughness
max_Ra Å Maximum Ra over the roughness trace
Rq Å RMS roughness
Rh Å Peak-to-valley height

INLEQE

Base class: INLCharacterization, PlotSection
Label: INL EQE

External Quantum Efficiency measurement. Plots EQE (%) vs. wavelength (nm) and stores scalar parameters extracted from the curve.

File format: upload a *eqe*.txt file (case-insensitive) — the parser creates the entry automatically.

Quantities

Quantity Type Unit Description
wavelength float[] nm Wavelength array
quantum_efficiency float[] EQE values (fraction 0–1)

Sub-sections

Sub-section Type Description
results EQEResult (repeats) Scalar parameters extracted from the curve

EQEResult

Quantity Unit Description
jsc mA/cm² Short-circuit current density (AM1.5G integration)
bandgap eV Bandgap estimated from EQE
device_id Device identifier
chopping_frequency Hz Chopping frequency used
light_bias_current mA Light bias current
voltage_bias V Voltage bias applied

INLSolarCellIV

Base class: INLCharacterization, PlotSection
Label: INL Solar Cell IV

Solar cell current–voltage measurement. Plots the best-cell JV curve and, when multiple cells are measured, boxplots of Voc, Jsc, FF, and efficiency.

File format: upload a *Results Table*.txt file (case-insensitive) — the parser creates the entry automatically.

Sub-sections

Sub-section Type Description
results SolarCellIVResult (repeats) Extracted parameters per cell
iv_curves SolarCellIVCurve (repeats) Raw I-V curve data per cell

SolarCellIVResult

Quantity Unit Description
voc V Open-circuit voltage
isc A Short-circuit current
jsc mA/cm² Short-circuit current density
vmax V Voltage at maximum power
pmax mW Maximum power
fill_factor Fill factor (0–1)
efficiency Power conversion efficiency (0–1)
cell_area cm² Active cell area
r_shunt Ω·cm² Area-normalised shunt resistance
r_series Ω·cm² Area-normalised series resistance
r_at_voc Ω Differential resistance at Voc
r_at_isc Ω Differential resistance at Isc
exposure s Illumination exposure time

SolarCellIVCurve

Quantity Unit Description
measurement_name Label matching the corresponding SolarCellIVResult
voltage V Measured voltage array
current A Measured current array

Normalization behavior

  • Plots the JV curve for the cell with the highest efficiency (current density in mA/cm² when cell_area is available; raw mA otherwise)
  • When more than one cell is present, adds boxplots of Voc, Jsc, FF, and efficiency

INLGDOES

Base class: INLCharacterization, PlotSection
Label: INL GDOES

Glow Discharge Optical Emission Spectroscopy depth profile. Plots elemental concentration (mol %) vs. depth (µm) with one trace per element.

File format: upload a *gdoes*.txt file (case-insensitive) — the parser creates the entry automatically.

Quantities

Quantity Type Unit Description
depth float[] µm Depth profile values

Sub-sections

Sub-section Type Description
element_profiles GDOESElementProfile (repeats) Per-element concentration profile

GDOESElementProfile

Quantity Description
element_name Element label as it appears in the data file
concentration Concentration values (mol %)

INLSEMSession

Base class: INLCharacterization, PlotSection
Label: INL SEM Session

One or more SEM images acquired during a single microscope session. Acquisition metadata is parsed from the FEI/ThermoFisher TIFF tag 34682. A gallery figure is generated with all images stacked vertically.

File format: upload a ZIP containing FEI/TFS TIFF files, or drop the base image file directly. The parser matches files named YYMMDD - <name>.tif (no _NNN suffix) and collects all related images (YYMMDD - <name>_001.tif, _002.tif, …) into a single INLSEMSession entry.

Quantities

Quantity Type Description
microscope_model str Model name from System/SystemType
source_type str Electron source type from System/Source

Sub-sections

Sub-section Type Description
images INLSEMImage (repeats) Individual images in the session

INLSEMImage

Holds pixel data and all acquisition metadata for one image. A calibrated (µm-axis) Plotly heatmap is generated per image during normalization.

Quantity Unit Description
file_name File name within the ZIP
label User annotation
image_array Grayscale pixel data (downsampled to ≤ 1024 px)
accelerating_voltage kV Beam voltage
magnification Nominal magnification
horizontal_field_width µm Physical width of the full image
pixel_width nm Physical width of one pixel
working_distance mm Working distance
detector_name Detector name (e.g. ETD, CBS)
detector_mode Signal mode (e.g. SE, BSE)
emission_current µA Source emission current
dwell_time µs Pixel dwell time
stage_x / y / z mm Stage position
stage_tilt ° Stage tilt angle
acquisition_datetime Date and time of acquisition
operator Operator username

INLEDXSpectrum

Base class: INLCharacterization, PlotSection
Label: INL EDX Spectrum

Energy-Dispersive X-ray (EDX/EDS) spectrum acquired in a SEM, parsed from an EMSA/MAS text file. Plots counts vs. energy (keV) automatically.

File format: upload any .txt, .msa, .emsa, or .ems file whose contents contain the header line #FORMAT : EMSA — the parser creates the entry automatically.

Acquisition quantities

Quantity Type Unit Description
beam_energy float keV Accelerating voltage
live_time float s Detector live time
real_time float s Real (clock) time
probe_current float nA Electron probe current
magnification float SEM magnification
tilt_angle float ° Stage X tilt angle
elevation_angle float ° Detector elevation angle
azimuth_angle float ° Detector azimuth angle
x_stage_position float mm Stage X position
y_stage_position float mm Stage Y position
z_stage_position float mm Stage Z / working distance
signal_type str Signal type from EMSA header (e.g. EDS)
n_channels int Number of spectrum channels
energy_per_channel float keV Energy width per channel (XPERCHAN)
energy_offset float keV Energy offset of channel zero (OFFSET)
vendor_annotations str Raw vendor-specific header lines (e.g. Oxford Instruments)

Sub-sections

Sub-section Type Description
results EDXSpectrumResult (repeats) Raw spectral data

EDXSpectrumResult

Quantity Unit Description
energy_axis keV Energy axis values (one per channel)
counts Raw X-ray counts per channel

Normalization behavior

  • Plots counts vs. energy (keV) for the first EDXSpectrumResult

INLAFMSession

Base class: INLCharacterization, PlotSection
Label: INL AFM Session

Bruker NanoScope AFM/KPFM/cAFM session from a single numbered binary file. Technique is auto-detected from channel names.

File format: upload a Bruker binary file with a numbered extension (.001, .002, …) — the parser creates the entry automatically.

Quantities

Quantity Type Unit Description
technique str Auto-detected technique: AFM, KPFM, or cAFM
scan_size_x float nm Fast-scan axis physical size
scan_size_y float nm Slow-scan axis physical size
scan_lines int Number of scan lines (slow-scan pixels)
samples_per_line int Number of samples per line (fast-scan pixels)
scan_rate float Hz Line scan rate

Sub-sections

Sub-section Type Description
channels INLAFMChannel (repeats) All image channels in the file

INLAFMChannel

Quantity Description
name Channel name (e.g. Height Sensor, Surface Potential)
unit Physical unit of z-data (e.g. nm, V, A)
is_interleave True for interleave-pass channels (e.g. KPFM Potential)

Normalization behavior

  • Channel pixel data is reloaded from the original binary source file on every normalization (not stored in the YAML archive, to keep file sizes small)
  • A calibrated Plotly heatmap (µm axes) is generated for each channel
  • Technique detection: KPFM if any channel name contains Potential; cAFM if any channel contains Current; otherwise AFM

EISMeasurement

Base class: INLCharacterization, PlotSection
Label: INL EIS Measurement
Ontology: voc4cat:0007206

Potentio- or Galvano-EIS measurement from a Bio-Logic potentiostat. Stores the full impedance spectrum and auto-generates Nyquist and Bode plots.

File format: upload a Bio-Logic .mpr file containing a PEIS or GEIS experiment — the parser creates the entry automatically.

Quantities

Quantity Type Unit Description
area_electrode float cm² Active working electrode area
electrode_material str Working electrode material
electrolyte str Electrolyte description
reference_electrode str Reference electrode used
frequency_initial float Hz Highest frequency of the sweep
frequency_final float Hz Lowest frequency of the sweep
amplitude float mV AC perturbation amplitude
description str Free-text comments from the instrument file

Data arrays

Quantity Unit Description
frequency Hz Frequency axis
real_impedance Ω Real part Re(Z)
imaginary_impedance Ω Imaginary part −Im(Z) (positive in capacitive region)
modulus Ω Impedance modulus |Z|
phase ° Impedance phase angle

Normalization behavior

  • Generates a Nyquist plot: −Im(Z) vs. Re(Z) with equal-axis scaling
  • Generates a Bode plot: |Z| and phase vs. log-frequency (two stacked panels)

MPR parser (CV, IV, EIS auto-detection)

A single parser handles all Bio-Logic .mpr binary files. The technique is auto-detected from column presence in the data:

Columns present Detected technique Schema created
freq/Hz EIS EISMeasurement
cycle number CV PotentiostatMeasurement (with scan)
neither IV / LSV PotentiostatMeasurement (no scan)

Metadata (electrode area, material, electrolyte, reference electrode, scan rate) is read via yadg where supported, with automatic fallback to reading the binary VMP Set module directly (used for EIS files, which yadg does not yet support).