Reference – Shared Entities¶
This page documents all shared entity entry types provided by nomad-inl-base.
These entries are created once and referenced by deposition and characterization
schemas throughout the experiment lifecycle.
INLSubstrate¶
Category: INL Entities
Base class: Substrate, INLSample, EntryData
Label: INL Substrate
A physical substrate entry. Default geometry (25 × 25 × 1 mm) is filled in automatically if none is provided.
| Quantity | Type | Default | Description |
|---|---|---|---|
name |
str |
– | Human-readable name (inherited) |
lab_id |
str |
– | Unique lab identifier (inherited) |
material |
str |
SLG |
Substrate material |
location |
str |
– | Physical location (fridge, glovebox, …) |
status |
enum |
– | active, in use, consumed, broken, or archived |
Sub-sections:
| Sub-section | Type | Description |
|---|---|---|
geometry |
Geometry |
Physical dimensions (auto-filled as 25×25×1 mm) |
INLThinFilm¶
Category: INL Entities
Base class: ThinFilm, INLSample, EntryData
Label: INL Thin Film
A single deposited layer. Geometry height is set from thickness during
normalization. Usually created automatically by deposition entries when
Create / append film is toggled.
| Quantity | Type | Unit | Description |
|---|---|---|---|
material |
str |
– | Material identifier |
thickness |
float |
nm | Film thickness (also sets geometry.height) |
location |
str |
– | Physical location |
status |
enum |
– | Sample status |
INLThinFilmStack¶
Category: INL Entities
Base class: ThinFilmStack, INLSample, EntryData
Label: INL Thin Film Stack
A substrate + one or more thin-film layers combined into a single sample entry.
During normalization, substrate dimensions are propagated to each film's geometry
and components is rebuilt automatically.
| Quantity | Type | Description |
|---|---|---|
location |
str |
Physical location |
status |
enum |
Sample status |
Sub-sections:
| Sub-section | Type | Description |
|---|---|---|
substrate |
INLSubstrateReference |
Substrate the layers were deposited on |
layers |
INLThinFilmReference (repeats) |
Ordered thin-film layers (bottom → top) |
components |
SystemComponent (repeats) |
Built automatically during normalization |
INLInstrument¶
Category: INL Entities
Base class: Instrument, EntryData
Label: INL Instrument
A persistent record of a laboratory instrument. Used as a reference target in deposition and characterization entries.
| Quantity | Type | Description |
|---|---|---|
name |
str |
Instrument name (inherited) |
supplier |
str |
Manufacturer or supplier |
lab_id |
str |
Lab identifier where the instrument is located |
Sub-sections:
| Sub-section | Type | Description |
|---|---|---|
maintenance_log |
INLMaintenanceLog (repeats) |
Chronological log of maintenance events |
INLMaintenanceLog¶
| Quantity | Type | Description |
|---|---|---|
date |
Datetime |
Date and time of the event |
performed_by |
str |
Person who performed the maintenance |
description |
str |
Rich-text description of work performed |
INLGraphiteBox¶
Category: INL Entities
Base class: INLInstrument
Label: INL Graphite Box
A graphite box used in tube furnace annealing processes. Inherits all
INLInstrument fields.
Sub-sections:
| Sub-section | Type | Description |
|---|---|---|
geometry |
RectangleCuboid |
Dimensions of the box (length × width × height) |
INLSampleFragment¶
Category: INL Entities
Base class: INLSample, EntryData
Label: INL Sample Fragment
A fragment cut or broken from a parent sample (substrate, thin film, or stack) at any stage of preparation. Keeps the full provenance chain intact.
| Quantity | Type | Description |
|---|---|---|
parent_sample |
INLSample |
Reference to the parent sample |
fraction |
str |
Fraction label (e.g. 1/2, 1/4, triangle) |
cut_date |
Datetime |
Date when the fragment was separated |
location |
str |
Physical location |
status |
enum |
Sample status |