Reference

Detailed schema reference for all ELN entry types provided by nomad-inl-base.

• Entities – substrates, thin films, stacks, instruments, and sample fragments
• STAR Sputtering – target inventory, recipes, DC and RF sputtering
• Wet Deposition – recipe system and all 7 wet deposition methods
• Characterization – XRD, UV-Vis, 4PP, profiler, EQE, solar cell IV, GDOES, SEM, EDX/EDS spectra, AFM (Bruker NanoScope), EIS, CV, and chronoamperometry